AFM/STM Probes
AFM/STM Probes
"Whisker Type" probes are specially designed for researching deep trenches and control of near vertical sidewalls. Any inclination angle to match the SPM holder specification and different Whisker tip length can be produced at customer's requirement.
High Accuracy NonContact AFM probes HA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
High Accuracy Force Modulation AFM probes HA_FM series, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m.
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m.
High Accuracy NonContact AFM probes HA_NC series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
High Accuracy Force Modulation AFM probes HA_FM series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m.
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m.
High Resolution NONCONTACT "GOLDEN" Silicon AFM Probes NSG01 series, resonant frequency 87-230kHz, force constant 1,45-15,1N/m.
Subcategories
AFM probes ETALON series
ETALON is a new series of excellent composite AFM probes.
In terms of quality-to-price ratio, it has no analogues in the world market.
New Brand Technology of NT-MDT Combines All Critical Advantages in One Chip:
- Sharp tip (curvature radius less than 10 nm).
- Resonance frequency, specified with high accuracy (±10%).
- Special chip geometry for convenient operating.
- High aspect ratio tip.
- Enhanced back-side reflection of the cantilever.
Highly Specified Resonance Frequency
The ETALON Series probe have two polysilicon levers with a pedestal and monocrystal silicon tips.
Precision technology of polysilicon deposition guarantees the lever thickness control.
A special frequency stabilizer is designed to make the dispersion of the resonant frequency and force constant smaller (due to the lever length control).
Thanks to the above mentioned facts, the ETALON probes are characterized by highly reproducible parameters:
- Typical dispersion of the lever thickness: ±0.15 μm
- Typical dispersion of the lever length: ±2 μm
- Typical dispersion of the probe resonant frequency: ±10%
- Typical dispersion of the force constant: ±20%.
Comparison between ETALON and silicon probes
| Parameters | ETALON probes | Silicon cantilevers |
|
Thickness dispersion of the cantilever |
± 0.15 µm | ± 0.5 µm |
|
Length dispersion of the cantilever |
± 2 µm | ± 10 µm |
|
Resonant frequency dispersion |
± 10% | till ± 100% |
Noncontact/Semicontact/Force Modulation AFM
AFM cantilevers ETALON series for Noncontact/Semicontact/Force Modulation Modes with wide range of resonant frequencies and force constants.
Supplied with Au reflective coating, available without tips, with no coatings, with Pt conductive coating.
Conductive AFM probes
AFM cantilevers ETALON series for Conductive modes (SCM, SKM, SRI, EFM, I-V curve spectroscopy, voltage lithography) with Pt conductive coating, supplied with wide range of resonant frequencies and force constants.
Golden Series
Noncontact/Semicontact probes
AFM probes for Noncontact/Semicontact Modes with wide range of resonant frequencies and force constants.
Can be supplied with Au or Al reflective coating, without tips, bare, with conductive or magnetic coating.
Force Modulation Probes
AFM probes for Force Modulation Mode. Can be supplied with Au or Al reflective coating, without tips, bare, with conductive or magnetic coating.
Contact probes
AFM probes for CONTACT modes. Can be supplied with Au or Al reflective coating, without tips, bare, with conductive coating.
Conductive Noncontact/Semicontact probes
Any noncontact probes provides by NT-MDT (NSG01, NSG10, NSG03, NSG30, FMG01 series) are available with one of the following conductive coating - TiN, PtIr and Au.
Please, choose the coating you are interested in and see the cantilever specificaitons which are available with this coating.
Noncontact probes with PtIr conductive coating
Noncontact probes with TiN conductive coating
Noncontact cantilevers NSG01, NSG10, NSG03, NSG30, FMG01 series with TiN conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm.
Noncontact probes with Au conductive coating
Magnetic Probes
AFM probes for Magnetic mode (MFM) with CoCr magnetic coating.
Tipless probes
Noncontact/Semicontact and Contact AFM probes without tips.
"Whisker Type" probes --> high aspect ratio tips
"Whisker Type" probes are specially designed for researching deep trenches and control of near vertical sidewalls. Any inclination angle to match the SPM holder specification and different Whisker tip length can be produced at customer's requirement.
Noncontact/Semicontact "Whisker Type" probes
"Whisker Type" probes for noncontact/semicontact modes. Standard length of the Whisker for noncontact/semicontact modes is 1,0±0,2um (other Whisker length can be considered). At customer's requirement tip side of cantilever can be coated by conductive coating.
Contact "Whisker Type" probes
"Whisker Type" probes for contact modes. Standard length of the Whisker for contact modes is 0,4±0,1um (other Whisker length can be considered). At customer's requirement tip side of cantilever can be coated by conductive coating.
Other special probes
Other kinds of probes for special applications.
SNOM fiber probes
Colloidal probes
Cantilevers with submicron spheres attached to silicon tip
Cantilevers with micron spheres attached to tipless probes
Super Sharp (1nm) tips
Super sharp diamond-like carbon (DLC) tips with typical curvature radius 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips have very long lifetime due to the high material durability.
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