High Accuracy NonContact AFM probes HA_NC series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
Specification of HA_NC/Pt probe series:
| Material |
Polysilicon lever,
monocrystal silicon tip
|
| Chip size | 3.6 x 1.6 x 0.4 mm |
|
Reflective side Tip side |
Au (20-30 nm) Pt (20-30 nm) |
| Cantilever number | 2 rectangular |
| Tip shape | Octahedral at the base, conic on the last 200 nm |
| Tip cone angle φ | 30 degrees on the last 200 nm |
| Full tip height | ≥10 µm |
| Pedestal/tip ratio | 1:1 |
| Tip curvature radius | less than 35 nm |
| Cantilever type | A | B | Typical dispersion |
| Length, L (µm) | 94 | 124 | ± 2 |
| Width, W (µm) | 34 | 34 | ± 3 |
| Thickness, H (µm) | 1.85 | 1.85 | ± 0.15 |
| Force Constant (N/m) | 12 | 3.5 | ±20% |
| Resonant frequency (kHz) | 235 | 140 | ± 10% |