SOL instruments

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SOL instruments Ltd. is an innovation-focused Belarusian manufacturer of technologically advanced instruments for light measuring, elemental аnalysis and nano-scale micrоscopy.

For more than two decades we have devoted our knowledge, innovations and experience to spectrоscopy, micrоscopy, lasеrs and create robust tools for scientific and industrial applications in four business segments:

Raman Microscopy
Elemental Analysis
Spectroscopy
Lasers

We are proud to be a part of the world's most advanced scientific explorations and bring our innovations to the market of high performance equipment.

We are striving to be a reliable supplier of high-tech products and innovative solutions for customers' advanced needs and to offer top-level technical service and support all over the world.

Simple and fast measurements of the static pressure in a sample placed between the sapphire and diamond anvils in the high pressure camera using the method of laser optical luminescent spectroscopy.

Confotec CARS is a multifunctional multichannel 3D scanning laser microscope-spectrometer, combining in one system:

CARS scanning microscope
Raman/luminescent scanning confocal microscope
conventional scanning confocal laser microscope

Notable for its high resolution and high-speed scanning, the system allows of performing real time noninvasive analysis of biological samples (cells and components of living cells) with high spatial resolution.

Our innovative solutions guarantee:

High accuracy and precision determination of elements and their compounds (oxides) in the samples
Low detection limit of elements (from 0.01 ppm to 1ppb)
Analysis of various elements in any conductive, nonconductive solid (monolithic and powder) samples
Use of analytic lines at the optimal concentration sensitivity, free from spectral overlaps
Maximal efficiency of analytical light signal
Ease at operation and service
Safe operation and protection of personnel from harmful factors

Double pulse nano second laser

In the elemental analyzer LEA – S500 plasma of a sample material, arising due to the treatment of material with powerful light pulses, is used as a light source to obtain an atomic - emission spectrum.
It has been experimentally revealed, that when a sample is treated with two successive laser pulses (with time delay not exceeding the plasma lifetime) an essential growth of intensity and spectral lines stability in comparison with one-pulse excitation mode is provided. The given effect reduces substantially the lower limit of elements detection, increases measurements accuracy, extends analytical potential owing to excitation of lines with high ionization energy.

Detection system

The use of digital cameras with multi-element spectrum detection systems in spectral instruments is conditioned by a number of advantages before the traditional detection systems
(photo-electronic multipliers, photo-plates and etc.). The main of them are: the opportunity of simultaneous detection of a wide spectrum range; high-speed performance, providing detection of spectra excited with frequency pulsed sources, what allows one to make a large number of measurements per a time unit (in our case it is 20 times per second); wide range of spectral sensitivity; low dark signals (noise); wide dynamic range. As a radiation receiver in digital cameras matrix charge-coupled devices (CCD) are used, which are referred to the type of photosensitive (photoelectric) charge-transfer devices (CTD). Quantum efficiency of modern semiconductor radiation receivers is 90% and higher.

Spectrograph

Spectrograph performs radiation spectral analysis.
This analysis is realized in optics by means of an element deviating the beams with various wavelengths to different angles.

Advantages

Measuring of mass fraction (concentration) of chemical elements or their compounds (oxides) in a sample with minimal sample preparation
Express multi-element analysis
Multielement chemical analysis per one measurement
High sensitive and precise measurements in the wide concentration range
No change of a sample aggregate state
Sample analysis in the set points (areas) on the surface by means of positioning system and video surveillance
Layer-by-layer analysis of coatings, films, deposits, corrosion
Analysis of inclusions, flaws, defects
Analysis of elements distribution in a sample with the step from 30 mcm. Mapping of elements distribution over the surface, homogeneity control
No need in ultrapure reagents for a sample preparation
No need in expensive consumables
No need in inert gas to solve most of the tasks
Dirty sample surface is cleaned with the preliminary laser pulses
No need in re-configuration or modernization of the instrument to solve all the mentioned tasks
Analysis of conductive, non-conductive materials
Analysis of a wire of any diameter, balls, cylindrical details without additional processing using special
adapters (included in the delivery set)
Uncompromising operation safety, complete protection of the personnel from harmful factors

Laser elemental analyzer LEA-S500 is applied for qualitative, semi-quantitative and quantitative elemental (chemical) analysis of raw material, components, additives, admixtures, inclusions at all stages of manufacturing process; for control of finished products at factories; for scientific investigations.

The instrument allows to perform both general averaged multi-element analysis of a sample and local analysis of small
volume and mass.

Multi-element quantitative sample analysis including sample preparation takes from 1 to 15 minutes.

Analysis of any solid-state or powder materials:
ceramics, glass, cement
metals and alloys
slags
rubbers, caoutchoucs, plastics
micro-elements and admixtures in pure materials
chemical agents
ores, minerals and mono-mineral inclusions
natural materials (clays, sands, dolomite, soda, salt and etc.)
ash of herbal and animal origin
wooden materials
solid residue of liquids
frozen liquids
soil
dry plant materials

and other materials.

For analysis of solid-state, monolith materials (metals, alloys, glass, ceramics and etc.) no sample preparation is required or it lies in the obtaining of a plane section of a sample surface. For analysis of a transparent sample (glass, crystal) the area of analysis is additionally polished.

For the analysis of powdery samples (refractory components, slags, concentrates, sands, ash, etc.) the materials are ground with the subsequent pressing in tablets. Sample preparation of powder-state materials takes 10 – 40 min; with manual tools and 3 – 5 min; with the help of semi-automatic tools.

100 mg of a sample material is enough for the preparation of a tablet.

Detection limit means a minimal content of the element in a sample, detected with the instrument.

Usually a concentration, at which the analytical signal detected with the instrument equals to a triple value of a standard deviation of noise signal, is taken for a detection limit. Obtaining of such signal is a sufficient reason for making a decision on presence of the searched component.

Detection limit is a parameter sensitive to measurement conditions and a sample characteristic.

Detectable Elements

with selected detection limits, ppm

1 ppm = 0.0001%

100

0.01

0.07

<100

0.05

0.1

100

<100

0.06

0.1

0.3

0.2

0.5

0.2

0.8

0.1

0.5

<100

0.2

<100

200

<100

0.2

<100

0.1

0.2

<100

0.2

<100

0.3

<100

ATILLA 2 Software

ATILLA 2 is a powerful intuitive software instrument for the instrument control and measurements automation.

ATILLA 2 contains:

Spectral lines database
Certified reference materials database
Analyzed samples database (archive)

ATILLA 2 provides:

Automatic sample analysis
Calibration and re-calibration
Graphical imaging of the obtained spectrum
Sample surface observation, selection of any point or area for the analysis
Possibility for development of analytical programs by a user (selection of spectra excitation and detection
modes, selection of algorithms of spectral lines mathematical processing, calibration of the instrument)
Control of quality and reliability of the analysis results
Printing out the analysis results and their mathematical processing
Memory storage of unlimited number of analytical programs
Control over the instrument and the system state
Auto-calibration of a wavelength scale

Defectoscopy.
Analysis of inclusions and structural components

Material defect is a local change of chemical composition of the material affecting the properties of the material

Flaw (defect) detection is performed by means of comparison of pure glass spectra and the spectra of a defect. The positioning system of the LEA-S500 provides the pointing accuracy of 1 µm. For a qualitative analysis size of defect should be not less than 5 µm and for a quantitative analysis size of defect should be not less than 150 µm.

In the given case the zirconium inclusion indicates the destruction of the refractory laying in a glass-making furnace.

Diagnostics of destruction processes at initial stage allows to take preventive measures and to avoid expensive reconstructions. Time of analysis is about 2 min.

spektr def chist stek eng

The spectrum of the defect and the pure glass

Distribution of elements over the surface, homogeneity control

The control of elements distribution over the material surface provides new information about the analyzed samples. LEA-S500 allows high accurate, fast and low cost analysis. It also allows to analyze materials with a step of 100 µm.

This type of the analysis is recommended for specification of homogeneity specification at the certification of composition of reference materials.

fig4 map koncentr LEA 320x250 Concentration map of the element on the sample surface

Layer-by-layer analysis

Successive evaporation of sample material with the focused laser pulses provides elemental (chemical) analysis of composition and thickness of multi-layer coatings and thin films. Deposits, corrosion areas, sections with the damaged structure, composite materials, etc. can be investigated.

fig5 zerk poverh LEA 320x250

Analysis of the mirror surface with minimal path of 2х2 mm, 400 points

MS200 Series monochromators–spectrographs are compact general-purpose instruments which can be used as monochromators or spectrographs with a large flat focal field. They are completely automated spectral devices with focal length of 200 mm and F-number of 1/3.6. Despite of compact overall sizes the parameters of short-focus monochromators–spectrographs do not concede to the parameters of long-focal spectral devices of other manufacturers.

MS200 Series monochromator-spectrographs are based on Cherny–Turner asymmetric scheme that allows to minimize of aberrations and exclude spectra re-entrance from diffraction gratings and mirrors.

High-quality optics and wide choice of diffraction gratings provide devices operation in a wide range from 185 nm up to 60 µm (depending on the selected grating).

Model MS2001i and model MS2004i have the astigmatism-corrected optics what makes these devices applicable in multi-channel spectroscopy.

A single-position holder for easy manual switching of gratings is used in both models MS2001 and MS2001i. A wide choice of changeable gratings gives the best combination of high energetic efficiency and maximal spectral resolution for different spectrum areas.

Automated four-grating turret (model MS2004 and model MS2004i) provides a fast switching of gratings with high repeatability of the set wavelength. Monochromators–spectrographs of MS200 series have one input port and two output ports. Selection of an output port is realized with an automated mirror. Either output spectral slits or multi-channel detectors can be installed on each of the output ports.

We offer monochromators–spectrographs of MS200 Series with two types of input and output spectral slits: manual, operated with a micrometer screw and automated (combined) when the slit width is operated automatically or manually (with micrometer).

Compactness in combination with technical characteristics make monochromators–spectrographs of MS200 Series ideal for OEM applications in customized spectroscopy systems.

M200

Sh MS2001 2001i

Sh MS2004 2004i

	MS2001	MS2001i	MS2004	MS2004i
Diffraction unit	Single-position holder for manually changeable gratings	Single-position holder for manually changeable gratings	Four–grating turret	Four–grating turret
Optics	Standard	Astigmatism–compensated (Imaging)	Standard	Astigmatism–compensated (Imaging)

In the devices with the standard optics (model MS2001 and model MS2004) a flat entrance deflecting mirror is used, and in the astigmatism–compensated devices (model MS2001i and model MS2004i) a cylindrical mirror is used as an entrance deflecting.

As well as in all Czerny–Turner design spectral devices, in the MS200 series an axis of the diffraction gratings rotation goes through the center of grating operating surface and coincides with the direction of grooves. This fact provides the stability of the geometry of the beams for formation of a flat and fixed focal field. The image quality in the whole flat focal field is optimized due to the use of an asymmetric scheme and use of a focusing large-size mirror allows one to use the whole focal field width without vignetting. Besides, Cherny–Turner asymmetric scheme provides a low level stray light and light re-entrance from the optical elements and detectors can be avoided.

Our products

Accessories

Resources

SOL instruments_uk

SOL instruments_uk

SOL instruments

Laser confocal luminescent microscope Rubin

Confotec CARS

Confotec MR200

3D Scanning Laser Raman Confocal Microscope Confotec® series MR350, MR520, MR750

3D Scanning Laser Confocal Raman Microscope Confotec® NR500

LEA-S500® Elemental Analyzer

Our innovative solutions guarantee:

Double pulse nano second laser

MS200

Subcategories

Raman Microscopy

Elemental Analysis

Spectroscopy