Features

• Extremely low dark counts
• Linear response due to single event counting
• 3 MHz count rate in 2D and 2D/time resolved mode
• Retrofitable on site, without changes to the analyzer

Applications

• Fermi surface mapping
• Band structure mapping
• Photoelectron diffraction measurements
• Angular dispersion experiments in 2D mode
• XPS, UPS, ESCA and AES in 7 channel mode
• Stroboscopic experiments in 2D/time resolved mode
• Time-of-flight measurements

Product Description

The delayline detector combines high countrates (3 MHz) with extremely high time resolution (190 ps) in one device. It is a time resolved 2D detector, equipped with two lateral and one time dimension and can be mounted on a PHOIBOS 100 or 150 analyzer. The delayline method is based on measuring the time differences of signals.