Punte TOP VISUAL per noncontatto (frequenza di risonanza tipica 300 kHz, costante di forza tipica 50 N/m), rivestimento riflettente di Al.
TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P/IR series
TOP VISUAL probes intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).
Image in optical microscope |
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VIT_P series specification |
Material |
Si |
Chip size |
3.4x1.6x0.3mm |
Reflective side coating |
Au |
Front coating |
None |
Cantilever number |
1 rectangular |
Tip curvature radius |
typical 6nm, guaranteed 10nm |
Tip shape |
Pyramidal |
Tip height |
14-16 um |
Cantilever series |
Cantilever length, L±5µm |
Cantilever width, W±3µm |
Cantilever thickness, T±0.5 µm |
Resonant frequency, kHz |
Force constant, N/m |
||||
min |
typical |
max |
min |
typical |
max |
||||
VIT_P/IR |
140 |
50 |
5.0 |
200 |
300 |
400 |
25 |
50 |
95 |