Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
Grating description
Structure: |
- glass wafer |
Pattern types: |
1- Dimensional (in the X or Y direction) |
Pattern height: |
> 55 nm provides good image contrast |
Geometry: |
parallel ridges |
Period: |
278 nm (3600 periods/mm) |
Accuracy: |
±1nm |
Size: |
diameter 12,5 mm, thickness - 2,5 mm |
Effective area: |
central diameter 9 mm. |
Fig.1 TDG01 grating