Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
Grating description
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Structure: |
- glass wafer |
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Pattern types: |
1- Dimensional (in the X or Y direction) |
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Pattern height: |
> 55 nm provides good image contrast |
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Geometry: |
parallel ridges |
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Period: |
278 nm (3600 periods/mm) |
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Accuracy: |
±1nm |
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Size: |
diameter 12,5 mm, thickness - 2,5 mm |
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Effective area: |
central diameter 9 mm. |

Fig.1 TDG01 grating
