Pra.Ma.

That theory is worthless. It isn't even wrong!

Wolggang Pauli
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Our products

  • Minus K Technology
  • NT-MDT
    • Minus K Technology
    • Automated AFM
    • BIO-AFM
    • AFM - Raman - SNOM - TERS
    • Modular AFM
  • Microsplav
    • The RTIM machine
    • Applications
  • Rtec Instruments
    • Multi function tribometer MFT-5000
  • SPECS
    • Spectroscopy
      • Detectors
    • Microscopy
  • SOL instruments
    • Raman Microscopy
    • Elemental Analysis
    • Spectroscopy/Imaging
  • UHV components
  • Alemnis
    • Alemnis Standard Assembly
  • ALTAMIRA INSTRUMENTS
    • AMI Family: Catalyst Characterization
    • BenchCAT™ : Customized Reactor Systems
    • µBenchCAT Bench-top Microreactor
    • Harsh Environment Systems
  • HIDEN ANALYTICAL
    • Gas Analysis
    • Dissolved Gas Analysis and Electrochemistry
    • Catalysis and Thermal Analysis
    • Thin Films, Plasma and Surface Engineering
    • Surface science
    • Residual Gas Analysis
    • Software
    • Applications
      • Gas Analysis
  • Korvus Technology
    • Thin films deposition systems
    • Deposition Components

Accessories

  • AFM/SPM probes
  • Etalon series
    • Noncontact/Semicontact/Force Modulation AFM probes
    • Conductive AFM probes
  • GOLDEN series
    • Noncontact/Semicontact probes
    • Force Modulation Probes
    • Contact probes
    • Conductive Noncontact/Semicontact probes
      • Noncontact probes with PtIr conductive coating
      • Noncontact probes with TiN conductive coating
      • Noncontact probes with Au conductive coating
    • Magnetic probes
    • Tipless probes
  • Super Sharp (1nm) tips
  • "Whisker Type" probes --> high aspect ratio tips
    • Noncontact/Semicontact "Whisker Type" probes
    • Contact "Whisker Type" probes
  • Other special probes
    • Diamond Coated Conductive Probes
    • TOP VISUAL Probes
    • SThM probes
    • SNOM fiber probes
    • Colloidal probes
      • Cantilevers with submicron spheres attached to silicon tip
      • Cantilevers with micron spheres attached to tipless probes
  • Calibration Gratings
    • AFM calibration
    • AFM submicron calibration (278nm)
    • Test grating for SNOM
    • Grating sets
  • HOPG, Substrates, Test Samples
    • HOPG ZYA quality
    • HOPG ZYB quality
    • Sapphire substrates
    • Mica
    • Test samples
  • Consumables for pin on disk tribometers

Resources

  • Frequently asked questions
  • AFM artifacts
  • Downloads

Links

Magazines

  • Hits: 844
    Web Link Microscopy Today

    A Publication of the Microscopy Society of America

  • Hits: 964
    Web Link Microscopy and Analysis

    Copyright (c) 2013. John Wiley & Sons Ltd. All rights reserved.

  • Hits: 1146
    Web Link Review of Scientific Instruments

    Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.

  • Hits: 1069
    Web Link Nanotechnology

    Nanotechnology encompasses the understanding of the fundamental physics, chemistry, biology and technology of nanometre-scale objects.


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