noncontact probes NSG30 series with TiN conductive coating, resonant frequency 240-440kHz, force constant 22-100N/m.

 

NSG30/TiN series specification 

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side

Au

Conductive coating

TiN (25nm)

Cantilever number

1 rectangular

Tip curvature radius

~ 35nm

Also available coatings

conductive PtIr, Au

Available NSG30 probes 

bare, tipless, with Al reflective coating

 

   

 

 

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG30

125

40

4.0

240

320

440

22

40

100