Probes for noncontact/semicontact modes NSG01 series with PtIr conductive and reflective coatings coating (resonant frequency 87-230kHz, force constant 1,45-15,1N/m) compartible with SOLVER NANO and NANOEDUCATOR II microscopes (NT-MDT Co.)
NSG01_Ed/Pt series specification
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Material
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Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
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Chip size
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3.4x1.6x0.3mm
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Reflective and tip side
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PtIr
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Cantilever number
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1 rectangular
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Tip curvature radius
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About 35nm
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Cantilever series |
Cantilever length, L±5µm
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Cantilever width, W±3µm
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Cantilever thickness,
T±0.5 µm
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Resonant frequency, kHz
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Force constant, N/m
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||||
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min
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typical
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max
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min
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typical
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max
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||||
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NSG01_Ed/Pt
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125
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30
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2.0
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87
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150
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230
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1.45
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5.1
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15.1
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