NSG20/W2C Stampa E-mail
nsgw2c.jpgPunte per non contatto della serie NSG20 con rivestimento conduttivo di W2C, frequenza di risonanza 260-630kHz, costante di forza 28-91N/m.

nsg01w2ca.jpg

NSG20/W2C

 

High Resonant Frequency NONCONTACT "GOLDEN" Silicon Cantilevers NSG20 series with W2C conductive coating

 

  • Standard chip size: 1.6x3.6x0.4 mm.
  • Compatible with the most commercial SPM devices.
  • High reflective Au coating (reflective property is 3 times better in comparison with uncoated cantilevers).
  • Tip side of the chip is coated by W2C conductive coating.
  • Thickness of W2C film is 20-30nm.
  • Typical curvature radius of a tip: 35 nm.
  • Tip height: 10 - 15 µm.
  • Each chip has one TRIANGULAR spring.
  • Recommended for semicontact modes and force lithography.
  • Packaged in GelPak® boxes.

GelPak® is a registered trade mark of Vichem Corporation.

 

Specification for NSG20 series

 

 

Chip thickness 0.4mm
Reflective side Au
Spring number 1
Aspect ratio 3:1
Cone angle j <=22°
Curvature radius of a tip typical 10nm
   nsg20w2cb.jpg

 

 

Cantilever series

 

Available Cantilever series Cantilever lenght, L±5µm Cantilever width, W±3µm Cantilever thickness, µm Resonant frequency, kHz Force constant, N/m
min typical max min typical max min typical max
NSG20 90 60 1.7 2.0 2.3 260 420 630 28 48 91

 

 

nsg01w2cc.jpg
Recommended measuring mode
N - noncontact, semicontact
C - contact
cantilever series S - with calibrated SEM photo for each tip and guaranteed curvature radius 10nm or less.

 

 

Copyright © 2003, Nano Technology Instruments - Europe BV.
Copyright © 1998-2003, NT-MDT. All rights reserved.
 
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