 Punte per non contatto/semicontatto della serie NSG20S, con immagine SEM calibrata di ciascuna punta, frequenza di risonanza 260-630kHz, costante di forza
28-91N/m.
NSG20S
| High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG20S series with calibrated SEM photo for each cantilever tip |
- Standard chip size: 1.6x3.6x0.4 mm.
- High reflective Au coating (reflective property is 3 times better in comparison with uncoated cantilevers).
- Guaranteed curvature radius of a tip: 10 nm or less.
- Tip height: 10 - 15 µm.
- Each chip has one RECTANGULAR spring.
- Recommended for noncontact/semicontact modes.
- Calibrated SEM photo for each cantilever tip.
- Packaged in GelPak® boxes.
GelPak® is a registered trade mark of Vichem Corporation.
| Specification for probes of NSG20S series |
| Chip thickness |
0.4mm |
| Reflective side |
Au |
| Spring number |
1 |
| Aspect ratio |
3:1 |
| Cone angle j |
<=22° |
| Curvature radius of a tip |
typical 10nm |
|
 |
| Available Cantilever series |
Cantilever lenght, L±5µm |
Cantilever width, W±3µm |
Cantilever thickness, µm |
Resonant frequency, kHz |
Force constant, N/m |
| min |
typical |
max |
min |
typical |
max |
min |
typical |
max |
| NSG20S |
90 |
60 |
1.7 |
2.0 |
2.3 |
260 |
420 |
630 |
28 |
48 |
91 |
- Calibrated SEM photo for each cantilever tip and guaranteed curvature radius 10nm or less.
- Compatible with the most commercial SPM devices.
- Chemically stable Au coating.
- Silicon is doped by boron with the concentration about 5x1020 cm-3 to avoid electrostatic charges.
 |
Recommended measuring mode
N - noncontact, semicontact
C - contact |
cantilever series |
S - with calibrated SEM photo for each tip and guaranteed curvature radius 10nm or less. |
Copyright © 2003, Nano Technology Instruments - Europe BV.
Copyright © 1998-2003, NT-MDT. All rights reserved.
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