TGS1 Stampa E-mail
tgs1.jpgSet di reticoli per la calibrazione di SPM lungo l'asse Z con tre diversi range di altezza: 20nm, 100nm, 500m.

tgs1a.jpg

TGS1

 

 

Grating set TGS1

 

Calibration grating set TGS1 is intended for Z-axis calibration of scanning probe microscopes and nonlinearity measurements.
Grating set contains 3 grating TGZ1, TGZ2, TGZ3 with different step heights.

tgs1b.jpg

 

Grating description
Structure: - Si wafer
- the grating is formed on the layer of SiO2
Pattern types: 1- Dimensional (in Z-axis direction)
Step height: TGZ1 - 18,5±1nm
TGZ2 - 108,5±2nm
TGZ3 - 535±4nm
Period: 3±0,1µm
Chip size: 5x5x0,5mm
Effective area: central square 3x3mm

 

tgs1c.jpg

Fig.1 SEM photo of TGZ3 grating

 

 

Copyright © 2003, Nano Technology Instruments - Europe BV.
Copyright © 1998-2003, NT-MDT. All rights reserved.
 
< Prec.   Pros. >

Se non sei parte della soluzione, allora sei parte del precipitato

Henry J. Tillman

 

PraMa Strumentazione Scientifica

Partita IVA n. 00668970148

Joomla Templates by JoomlaShack Joomla Templates by Compass Design

Valid XHTML 1.0 Transitional