Pra.Ma.

1. Monocromatore a specchio toroidale ad alta trasmissione - TMM 302
(SPECS/Sources - Italian)

2. Filtro di massa di Wien (per sorgenti di ioni)
(SPECS/Sources - Italian)

3. Tool di deconvoluzione
(NT-MDT/Software - Italian)

Strumento per caratterizzare la punta e ricostruire l'immagine reale della superficie. Questo tool rende reali le immagini dei vostri campioni.

4. NSG20/Au
(Probes/Coated)

Noncontact SPM probes NSG20 series with Au conductive coating, resonant frequency 260-630kHz, force constant 28-91N/m. NSG20/Au   High Resonant Frequency N

5. NSG11/Au
(Probes/Coated)

Noncontact SPM probes NSG11 series with Au conductive coating, each chip has 2 rectangular cantilevers, resonant frequency 190-325kHz, 115-190kHz; force constant 5,5-22,5N/m, 2,5-10N/m.

6. NSG10/Au
(Probes/Coated)

Noncontact SPM probes NSG10 series with Au conductive coating, resonant frequency 190-325kHz, force constant 5,5-22,5N/m. NSG10/Au   High Resolution NONCONT

7. NSG01/Au
(Probes/Coated)

Noncontact SPM probes NSG01 series with Au conductive coating, resonant frequency 115-190kHz, force constant 2,5-10N/m. NSG01/Au   High Resolution NONCONTAC

8. NSG20/TiN
(Probes/Coated)

Noncontact SPM probes NSG20 series with TiN conductive coating, resonant frequency 260-630kHz, force constant 28-91N/m. NSG20/TiN/15   High Resonant Freque

9. 1.2.2 John G. Simmons Formula in a Case of Small, Intermediate and High Voltage (Field Emission Mode
(1. Scanning Tunnel Microscopy (STM)/1.2 Tunnel Current in MIM System)

According chapter 1.2.1, the approximate expression for the tunneling current in the MIM system can be written as [1]: , (1)

10. 2.1.2 Deflections under the vertical (normal) force component
(2. Scanning Force Microscopy (SFM)/2.1 Cantilever)

Let us determine the magnitude and direction of the deformation arising from the vertical force . Solution to this problem will allow to find components of the third column of te

11. 2.2.1 Cantilever-sample interaction potential. AFM operation modes
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

Introduction. Sample investigation is available thanks to the forces acting between a cantilever and a surface. They are quite different. One or another

12. 2.2.2.1 The Hertz problem definition
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

When the cantilever and the sample are in contact, elastic forces start to act giving rise to both the sample and tip deformations which can affect the acquired image

13. 2.2.2.2 The Hertz problem solution
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

The general solution to this problem is well known (see chapter 2.2.2.3) though it is written in an implicit form [1]. In order to get the general idea of the deformations in

14. 2.2.2.3 Exact Hertz problem definition and its solution in a general form
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

Let two solids be in a point contact (Fig. 1). We have to adopt the following simplifying assumptions [1]: Bodies are filled with uniform isotropic linearly elas

15. 2.2.2.4 The effect of elastic deformations during experiment
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

Materials destruction during scanning. Once the contact pressure is estimated according to formula (4) in chapter 2.2.2.2, it is easy to determine which materi

16. 2.2.2.5 Appendices
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

Appendix  1. An interesting fact is that if one sets equal scan parameters and uses the same probe when studying hard and soft samples, the first one can b

17. 2.2.3.1 Basic principles of the surface tension theory
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

n most cases, the sample under investigation contains on its surface a microscopic liquid film which affects much the cantilever interaction with the surface because

18. 2.2.3.2 Capillary force acting on the probe
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

Let us examine the effect of the surface tension on AFM measurements. [1]At the moment of a cantilever contact with a liquid film on a flat surface, the film surface reshapes pro

19. 2.2.4.1 Intermolecular Van der Waals force
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

The Van der Waals force or the intermolecular attractive force has three components of slightly different physical nature but having the same potential dependence on

20. 2.2.4.2 Van der Waals probe-sample attraction
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

As it is shown in the chapter on Van der Waals (VdW) forces, the potential of the molecules pairwise interaction depends on the distance as . The corresponding force is equal to

21. 2.2.7.1 The nature of adhesion
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

In Introduction we discussed two cases of cantilever-sample interaction within the range of molecular forces action: the Van der Waals attraction if tip is out of con

22. 2.2.7.2 The DMT model of solids adhesion
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

The DMT model [1, 2] (Derjagin, Muller, Toropov – 1975) is applied to tips with small curvature radius and high stiffness. It is assumed that deformed surfaces geomet

23. 2.2.7.3 The JKR model of solids adhesion
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

The JKR model [1] (Johnson, Kendall, Roberts – 1964-1971) applies to tips with large curvature radius (most likely to macroscopic bodies) and small stiffness. Such sy

24. 2.2.7.4 The Maugis model of solids adhesion
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

The Maugis mechanics [1] (1992) is the most composite and accurate approach. It can be applied to any system (any materials) with both high and low adhesion. The amou

25. 2.2.7.5 Comparison of DMT, JKR and Maugis models
(2. Scanning Force Microscopy (SFM)/2.2 Cantilever-Sample Force Interaction)

To compare the foregoing models we introduce the normalized radius of the contact area , force and penetration depth : (1)

26. 2.3.1 Natural oscillations
(2. Scanning Force Microscopy (SFM)/2.3 Linear Oscillations of Cantilever)

Consider the oscillating properties of the spring pendulum which is a point mass suspended from a motionless support by a massless spring having stiffness (Fig. 1).

27. 2.3.2 Oscillations in the presence of friction
(2. Scanning Force Microscopy (SFM)/2.3 Linear Oscillations of Cantilever)

In chapter 2.3.1 natural oscillations of the cantilever in the absence of external forces are considered. In real systems there always takes place the dissipation of

28. 2.3.3 Oscillations in the presence of external periodic driving force
(2. Scanning Force Microscopy (SFM)/2.3 Linear Oscillations of Cantilever)

Ideal case. Let the external periodic force act on a ball of the spring pendulum: (2) where .

29. 2.3.4 Cantilever small oscillations in a force field
(2. Scanning Force Microscopy (SFM)/2.3 Linear Oscillations of Cantilever)

Consider the case when in addition to the driving force (see (1) in chapter 2.3.3), an external force acts on an oscillator. The equation of motion in this case is written as

30. 2.3.5 Approach-retraction curves
(2. Scanning Force Microscopy (SFM)/2.3 Linear Oscillations of Cantilever)

Consider a cantilever oscillations near a sample surface. As shown in chapter 2.2.1, the tip-sample interaction potential has a characteristic appearance depicted in Fig. 1. As t