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NSG30

Punte per AFM in silicio per noncontatto ad alta risoluzione della serie NSG30, frequenza di risonanza 240-440kHz, costante di forza 22-100N/m.

NSG30 series specification

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side

Au

Cantilever number

1 rectangular

Tip curvature radius

typical 6nm, guaranteed 10nm

Available coatings

conductive PtIr, TiN, Au

Available probe

bare, tipless, with Al reflective coating

 

   

 

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG30

125

40

4.0

240

320

440

22

40

100

 

Prices

High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG30 series

NSG30 series specification

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side

Au

Cantilever number

1 rectangular

Tip curvature radius

typical 6nm, guaranteed 10nm

Available coatings

conductive PtIr, TiN, Au

Available probe

bare, tipless, with Al reflective coating

   

 

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG30

125

40

4.0

240

320

440

22

40

100