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Probes for noncontact/semicontact modes NSG01 series with PtIr conductive and reflective coatings coating (resonant frequency 87-230kHz, force constant 1,45-15,1N/m) compartible with SOLVER NANO and NANOEDUCATOR II microscopes (NT-MDT Co.)

 

NSG01_Ed/Pt series specification  

Material
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size
3.4x1.6x0.3mm
Reflective and tip side
PtIr
Cantilever number
1 rectangular
Tip curvature radius
About 35nm

Cantilever series

 
Cantilever length, L±5µm
Cantilever width, W±3µm
Cantilever thickness,
T±0.5 µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
NSG01_Ed/Pt
125
30
2.0
87
150
230
1.45
5.1
15.1