Surface Analysis Systems
Specialized & customized systems for Surface Analysis
SPECS
is specialized in the development and production of customized UHV
surface analysis systems. For the development and construction of these
highly customized research systems SPECS closely cooperates with
partner companies within the Network of Competence. By combining the expert knowledge of the network partners BESTEC , CreaTec and Surface Concept we offer complete solutions like Synchrotron Beamlines with
endstations, providing facilities for in-situ sample preparation (using
MBE, PLD and Sputtering techniques) and analysis by a variety of
methods, like XPS, UPS, ISS, AES, LEED, LEEM/PEEM, STM and more.
A selection of possible applications:
Moreover
SPECS offers compact solutions like the ESCA system SAGE and the SNMS
system INA-X for the control of wafer surface composition, depth
profiling of chemical concentrations and polymer surface composition
checks.
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