|
FE-LEEM P90 |
|
|
Features:
- 5 nm resolution
- 90° magnetic deflector
- Cold Field emitter
- Rapid LEED/LEEM switching
- Fast sample exchange
Product Description:
The FE-LEEM P90 is a next generation Low Energy Electron Microscope
with unsurpassed 5 nm resolution for dynamic LEEM microscopy
experiments. With this instrument, based on the design of Dr. Rudolf
Tromp, nanometer scale processes on surfaces can be observed in
real-time.
Guiding the design of the SPECS FE-LEEM P90 was
the goal to achieve an extremely high resolution with a minimum number
of electronoptical elements.
In order to achieve this incoming and outgoing electrons are separated by a
90° magnetic prism array. This geometry allows a simple, intuitive step
by step adjustment of all lens parameters. The magnetic prism transfers
both the LEEM image and the LEED pattern astigmatically, allowing
routine switching between real image and diffraction. Both image and
LEED pattern are transferred without the negative effects of chromatic
dispersion, offering superior image and diffraction capabilities.
A sophisticated energy filter enables imaging with an energy resolution
down to 250 meV with a minimal impact on the high spatial resolution of
the instrument.
The FE-LEEM P90 is integrated into a UHV LEEM
sample analysis chamber with facilities for sample preparation and
in-situ high temperature sample processing.
|
|
