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Diffraction Image Acquisition and Processing System or LEED and RHEED
- Windows ™ 98 to Windows ™ XP operating system supported
- high sensitivity analog (video) camera support with multiple entry 10 bit frame grabber board (standard)
- 12 bit digital camera support with peak quantum efficiency up to 62% (optional)
with
TCP/IP ARM interface (ARMIN) for primary energy control (0-10V output),
e-beam current readout (amplified 0-10V input) and additional parameter
(0-10V input), potential isolated
Specifications:
- switchable between RHEED and LEED mode
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variable exposure time n x 40ms (analog), 1 - 10 000 ms (digital)
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practically
unlimited number and shapes of sensors (straight, elliptical and
freeform lines; rectangular, circular, elliptical and freeform areas)
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point
(integrated intensity), line profile and plane (movie-like 2D intensity
distribution) scan of sensor vs. energy, time and free defined
parameter X (e.g. temperature T) for I(V), I(t) and I(T) measurements
for LEED
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point (integrated intensity), line profile and plane (movie-like 2D intensity distribution) scan of sensor vs. time for RHEED
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video recording with 1:1 recording of live image to hard disk
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pre-trigger with live arbitrary length buffer of measurement
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trigger with other measurements, sensor intensity or external signal possible
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time stamp with exact date and time recorded with each measurements
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repeat scan with synchronous repetitions of measurement stored in same data set
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R factor analysis (Pendry and R2) for LEED
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peak spacing for separation of reflections (lattice constant)
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peak width for FWHM of reflections (island size)
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averaging by integration in memory up to 16 bit dynamic range
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Kikuchi line analysis with fitting of pattern for RHEED: misorientation, crystal potential
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radar scan with horizontal 2D cuts through reciprocal space
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slice - plane and line scans; horizontal (space/time) and vertical
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integrate - plane and line scans; horizontal (space/time) and vertical
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Fourier transform - plane and line scans; horizontal (space/time) and vertical
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sine fit of point scans; amplitude, period, phase, damping
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running sine fit for point scans; analyzes variable period
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multitasking: measurements can run in parallel, independent of each other
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export formats: ascii, tiff and pgm
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