Instrumentation for Scanning Probe Microscopy (SPM)With Scanning Probe Microscopy (SPM) being a key technology for nanotechnology SPECS offers dedicated solutions for highly demanding requirements: The highly robust STM 150 Aarhus for variable temperature STM (Scanning Tunneling Micrcoscopy) studies and the CreaTec low temperature SPM (Scanning Probe Microscopy) solutions for atomic and molecular manipulation and spectroscopy at liquid helium temperatures. Within the Network of Competence these SPM solutions are manufactured, maintained and further developed on SPECS premises.
Versatile
solutions particularly with the need for true cantilever variable
temperature Atomic Force Microscopy (AFM) can be offered within the
strategic partnership with RHK Technologies. With these instruments developed in continuing collaborations with key scientists SPECS guarentees dedicated SPM research possibilities in the field of nanotechnology. | ||||||||||||
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Scanning Probe Microscopy
