NSG01/Co Print E-mail
coated.jpgNoncontact SPM probes NSG01 series with CoCr magnetic coating, resonant frequency 115-190kHz, force constant 2,5-10N/m.

nsg01coa.jpg

NSG01/Co

 

High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG01 series with CoCr magnetic coating

 

  • Standard chip size: 1.6x3.6x0.4 mm.
  • Compatible with the most commercial SPM devices.
  • High reflective Au coating (reflective property is 3 times better in comparison with uncoated cantilevers).
  • Tip side of the chip is coated by CoCr magnetic coating.
  • Thickness of CoCr film is about 40nm.
  • Typical curvature radius of a tip: 45 nm.
  • Tip height: 10 - 15 µm.
  • Each chip has one RECTANGULAR spring.
  • Recommended for MFM mode.
  • Packaged in GelPak® boxes
  • Guaranteed life time is 3 months from the date of order receiving.

GelPak® is a registered trade mark of Vichem Corporation.

 

Specification for probes of NSG01 series

 

 

Chip thickness 0.4mm
Reflective side Au
Spring number 1
Aspect ratio 3:1
Cone angle j <=22°
Curvature radius of a tip typical 10nm
nsg01cob.jpg

 

 

Cantilever series

Spring

Cantilever lenght, L±5µm

Cantilever width, W±3µm

Cantilever thickness, µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

min

typical

max

NSG01

A

130

35

1.7

2.0

2.3

115

150

190

2.5

5.5

10

 

 

Cantilever series

 

 

nsg01coc.jpg
Recommended measuring mode
N - noncontact, semicontact
C - contact
cantilever series S - with calibrated SEM photo for each tip and guaranteed curvature radius 10nm or less.

 

 

Copyright © 2003, Nano Technology Instruments - Europe BV.
Copyright © 1998-2003, NT-MDT. All rights reserved.
 
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PraMa Strumentazione Scientifica

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