CSG10/W2C Print E-mail
csgw2ca.jpgContact mode CSG10 series with W2C conductive coating, resonant frequency 14-28kHz, force constant 0,03-0,2N/m.

csgw2ca.jpg

CSG10/W2C

 

High Resolution CONTACT "GOLDEN" Silicon Cantilevers CSG10 series with W2C conductive coating

 

  • Standard chip size: 1.6x3.6x0.4 mm.
  • Compatible with the most commercial SPM devices.
  • High reflective Au coating (reflective property is 3 times better in comparison with uncoated cantilevers).
  • Tip side of the chip is coated by W2C conductive coating.
  • Thickness of W2C film is 20-30nm.
  • Typical curvature radius of a tip: 35 nm.
  • Tip height: 10 - 15 µm.
  • Each chip has one RECTANGULAR spring.
  • Recommended for contact modes.
  • Packaged in GelPak® boxes.

GelPak® is a registered trade mark of Vichem Corporation.

 

Specification for probes of CSG10 series

 

 

Chip thickness 0.4mm
Reflective side Au
Spring number 1
Aspect ratio 3:1
Cone angle f <=22°
Curvature radius of a tip typical 10nm
   csgw2cb.jpg

 

Cantilever series

Spring

Cantilever lenght, L±5µm

Cantilever width, W±3µm

Cantilever thickness, µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

min

typical

max

CSG10

A

250

35

0.7

1.0

1.3

14

20

28

0.03

0.1

0.2

 

Cantilever series

 

 

csg01e.jpg
Recommended measuring mode
N - noncontact, semicontact
C - contact
cantilever series S - with calibrated SEM photo for each tip and guaranteed curvature radius 10nm or less.

 

 

Copyright © 2003, Nano Technology Instruments - Europe BV.
Copyright © 1998-2003, NT-MDT. All rights reserved.
 
< Prev   Next >

Facts are not science - as the dictionary is not literature

Albert Einstein

 

PraMa Strumentazione Scientifica

Partita IVA n. 00668970148

Joomla Templates by JoomlaShack Joomla Templates by Compass Design

Valid XHTML 1.0 Transitional