Contact mode CSG11 series with W2C conductive coating, each chip has two cantilevers, resonant
frequency 7-14kHz, 14-28kHz; force constant 0,01-0,08N/m, 0,03-0,2N/m.
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Contact mode CSG10 series with W2C conductive coating, resonant frequency 14-28kHz, force constant 0,03-0,2N/m.
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Contact SPM probes CSG01 series with W2C conductive coating, resonant frequency 7-14kHz, force constant 0,01-0,08N/m.
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 Noncontact SPM probes NSG20 series with Au conductive coating, resonant frequency 260-630kHz, force constant 28-91N/m.
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 Noncontact SPM probes NSG11 series with Au conductive coating, each
chip has 2 rectangular cantilevers, resonant frequency 190-325kHz,
115-190kHz; force constant 5,5-22,5N/m, 2,5-10N/m.
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 Noncontact SPM probes NSG10 series with Au conductive coating, resonant frequency 190-325kHz, force constant 5,5-22,5N/m.
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 Noncontact SPM probes NSG01 series with Au conductive coating, resonant frequency 115-190kHz, force constant 2,5-10N/m.
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 Noncontact SPM probes NSG20 series with TiN conductive coating, resonant frequency 260-630kHz, force constant 28-91N/m.
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 Noncontact SPM probes NSG11 series with TiN conductive coating, each
chip has 2 rectangular cantilevers, resonant frequency 190-325kHz,
115-190kHz; force constant 5,5-22,5N/m, 2,5-10N/m.
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 Noncontact SPM probes NSG10 series with TiN conductive coating, resonant frequency 190-325kHz, force constant 5,5-22,5N/m.
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Noncontact/semicontact modes NSG03 series with TiN conductive coating,
resonant frequency 90-116kHz, force constant 0,5-2,2N/m.
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 Noncontact SPM probes NSG01 series with TiN conductive coating, resonant frequency 115-190kHz, force constant 2,5-10N/m.
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 Noncontact SPM probes NSG20 series with Pt conductive coating, resonant frequency 260-630kHz, force constant 28-91N/m.
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 Noncontact SPM probes NSG11 series with Pt conductive coating, each
chip has 2 rectangular cantilevers, resonant frequency 190-325kHz,
115-190kHz; force constant 5,5-22,5N/m, 2,5-10N/m.
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 Noncontact SPM probes NSG10 series with Pt conductive coating, resonant frequency 190-325kHz, force constant 5,5-22,5N/m.
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 Noncontact/semicontact modes NSG03 series with Pt conductive coating,
resonant frequency 90-116kHz, force constant 0,5-2,2N/m.
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 Noncontact SPM probes NSG01 series with Pt conductive coating, resonant frequency 115-190kHz, force constant 2,5-10N/m.
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 Noncontact SPM probes NSG01 series with W2C conductive coating, resonant frequency 115-190kHz, force constant 2,5-10N/m.
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 Noncontact/semicontact probes NSG03 series with W2C conductive coating,
resonant frequency 90-116kHz, force constant 0,5-2,2N/m.
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Read more...
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 Noncontact SPM probes NSG10 series with W2C conductive coating, resonant frequency 190-325kHz, force constant 5,5-22,5N/m.
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Read more...
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 Noncontact SPM probes NSG11 series with W2C conductive coating, each
chip has 2 rectangular cantilevers, resonant frequency 190-325kHz,
115-190kHz; force constant 5,5-22,5N/m, 2,5-10N/m.
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 Noncontact SPM probes NSG20 series with W2C conductive coating, resonant frequency 260-630kHz, force constant 28-91N/m.
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 Noncontact Diamond Coated Conductive Probes DCP11 series, each chip has 2 cantilevers, resonant frequency 190-325kHz, 115-190kHz; force constant 5,5-22,5N/m, 2,5-10N/m. Stable and nondestructive, wear resistant probes with conductive diamond coating allow you to use them for a long time.
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 Noncontact Diamond Coated Conductive Probes DCP20 series, resonant frequency 260-630kHz, force constant 28-91N/m. Stable and nondestructive, wear resistant probes with conductive diamond coating allow you to make as many images as you want. The ideal probes for making AFM Oxidation Nanolithography.
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 Contact SPM probes CSG01 series with Pt conductive coating, resonant frequency 7-14kHz, force constant 0,01-0,08N/m.
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 Contact SPM probes CSG10 series with Pt conductive coating, resonant frequency 14-28kHz, force constant 0,03-0,2N/m.
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 Contact SPM probes CSG11 series with Pt conductive coating, each chip has two cantilevers, resonant frequency 7-14kHz, 14-28kHz; force constant 0,01-0,08N/m, 0,03-0,2N/m.
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 Contact SPM probes CSG01 series with TiN conductive coating, resonant frequency 7-14kHz, force constant 0,01-0,08N/m.
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 Contact SPM probes CSG10 series with TiN conductive coating, resonant frequency 14-28kHz, force constant 0,03-0,2N/m.
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 Contact SPM probes CSG11 series with TiN conductive coating, each chip has two cantilevers, resonant frequency 7-14kHz, 14-28kHz; force constant 0,01-0,08N/m, 0,03-0,2N/m.
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 Contact SPM probes CSG01 series with Au conductive coating, resonant frequency 7-14kHz, force constant 0,01-0,08N/m.
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 Contact SPM probes CSG10 series with Au conductive coating, resonant frequency 14-28kHz, force constant 0,03-0,2N/m.
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 Contact SPM probes CSG11 series with Au conductive coating, each chip has two cantilevers, resonant frequency 7-14kHz, 14-28kHz; force constant 0,01-0,08N/m, 0,03-0,2N/m.
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 Noncontact SPM probes NSG01 series with CoCr magnetic coating, resonant frequency 115-190kHz, force constant 2,5-10N/m.
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 Noncontact SPM probes NSG03 series with CoCr magnetic coating, resonant frequency 90-116kHz, force constant 0,5-2,2N/m.
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