SPM system Solver MFM Print E-mail
Scanning Probe Microscopes

For many applications it is essential to analyze specimen magnetic properties in a variable external magnetic field by magnetic force microscopy (MFM) in the nanometer scale. For this NT-MDT has launched the new enhancement to its range of atomic force microscopes (AFM) which delivers the complete solution for observation of magnetization reversal processes and other phenomena that depend on magnetic field in the range up to 2 kGauss (0.2 Tesla).

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Early experiments include in-situ observations of the domain structure changes of permalloy rectangles, demagnetization process of a hard drive disk, magnetization reversal of a cobalt pattern, variation of anisotropy field across the yttrium iron garnet film thickness etc.

Features

  • As compared to other models, Solver MFM features all metallic parts of the measuring head and the landing and scanning unit made of non-magnetic materials. This prevents the movement of the probe when switched on or off as well as at the moment the orientation of the magnetic field is modified.
  • Solver MFM is equipped with the magnetic field generator, creating a magnetic field. The electromagnet is cooled by a water cooling system. The system consists of a liquid thermostat and water cooling hoses.
 
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