| SPM system Solver MFM |
|
|
| Scanning Probe Microscopes | |
|
For many applications it is essential to analyze specimen magnetic properties in a variable external magnetic field by magnetic force microscopy (MFM) in the nanometer scale. For this NT-MDT has launched the new enhancement to its range of atomic force microscopes (AFM) which delivers the complete solution for observation of magnetization reversal processes and other phenomena that depend on magnetic field in the range up to 2 kGauss (0.2 Tesla).
Early experiments include in-situ observations of the domain structure changes of permalloy rectangles, demagnetization process of a hard drive disk, magnetization reversal of a cobalt pattern, variation of anisotropy field across the yttrium iron garnet film thickness etc. Features
|
|
| < Prev | Next > |
|---|


