 Scanning Probe Microscope is a device for investigation of various
surfaces with resolution from micron down to the atomic scale. Scanning
probe microscopes can measure many surface characteristics such as
topography, friction, elastity, adhesion, surface conductivity,
potential distribution, local magnetic and electric fields etc. As a
result of the revolutionary development of SPMs, now more and more
scientists and engineers find them essential for their research work.
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Stand Alone SMENA expands the scope of SPM to bring you innovative facilities for investigating samples with unlimited size in all available SPM measuring modes. In spite of such versatile measuring capabilities Stand Alone SMENA has a very compact low weight design and reasonable price. SPM Smena consists of a stand-alone measuring head and an electronic module connected to a laptop or PC by the mean of interface board.
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SPM Solver P47H-PRO features its versatility. The number of available measurement and influence methods and modes reaches several tens. Scanning-by-probe scheme allows characterization of samples with sizes up to 100x100x20 mm There are varieties of the model for measurements in controlled gas environment, in liquids, with sample heating up to 130°C. Thus the device is used for investigations in biology and medicine, material study, studies of various coatings and thin films, polymer and nano-structure materials, chemistry and chemical industry, physics etc.
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The Solver P47-PRO SPM is a universal tool for complex research of different objects with the highest resolution in air, liquid and controlled gas at the temperature up to 130°C. This model can be used in small companies and university laboratories as well as in big research centers. Its modern design provides the highest measurement accuracy and a great number of SPM techniques.
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A Solver EC
system is intended to perform the electrochemical studies of adsorption
layers formation, metals deposition and dissolution in combination with
in situ monitoring the electrode/solution interface morphology by STM
with atomic scale resolution and tunnel spectroscopy.
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For many applications it is essential to analyze
specimen magnetic properties in a variable external magnetic field by
magnetic force microscopy (MFM) in the nanometer scale. For this NT-MDT
has launched the new enhancement to its range of atomic force
microscopes (AFM) which delivers the complete solution for observation
of magnetization reversal processes and other phenomena that depend on
magnetic field in the range up to 2 kGauss (0.2 Tesla).
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Solver HV is intended for work in high vacuum conditions and
controllable gas medium. Measuring head Smena HV is designed by vacuum
technology using vacuum compatible materials. The case of the head is
without covering. Its wires have no braid and sockets are metallized.
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Solver LS is a cutting-edge solution not only for
scientific research, but also for production monitoring. With this
sophisticated tool you can investigate and control samples (wafers)
with the size up to 250mm (300mm optional) in diameter and 15mm thick.
The motorized positioning stage and optical viewing system, which are
included in Solver LS, allow you to choose any place
visually and define a number of areas in different parts of the sample
to be scanned automatically. Due to a great number of features Solver LS is abundantly given, the range of application is almost endless.
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Scanning Near-Field Optical Microscopy (SNOM) is one of a number of types of Scanning Probe Microscopy (SPM). This is very powerful modern technique for surface investigation, which can provide the resolution about 50 nm.
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Solver BIO М is a special scanning probe microscope for biological and medical applications. It is based on the combination of inverted optical and scanning probe microscopes that enables optical sample surface visualization during the scanning process in different SPM modes.
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Solver PRO-M is a powerful and well-designed universal scientific SPM applicable to almost all areas that SPM can ever be exploited in. Some features make it unique in terms of electronics capability, probe movement precise measurements, and optical system convenience.
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