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tgz.jpgCalibration grating TGZ3 for SPM Z-axis calibration (step height 535±4nm).

tgz3a.jpg

TGZ3

Calibration Grating TGZ3

Calibration grating TGZ3 is intended for Z-axis calibration of scanning probe microscopes and nonlinearity measurements.

tgz3b.jpg

 

Grating description

Structure:

- Si wafer
- the grating is formed on the layer of SiO2

Pattern types:

1- Dimensional (in Z-axis direction)

Step height:

TGZ3 - 535±4nm

Period:

3±0,05µm

Chip size:

5x5x0,5mm

Effective area:

central square 3x3mm

tgz3c.jpg
Fig.1 SEM photo of grating TGZ series

 

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