NTEGRA platform Print E-mail
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NTEGRA platform
The concept
Applications

The PNL NTEGRA is a unique measuring system operating with the nanometer resolution. It includes:

  • A Scanning Probe Microscope. It allows researchers to use almost all known techniques of microscopy, spectroscopy, lithography and nanomanipulation for operation under ambient conditions, in liquid, in vacuum, at high and low temperatures.
  • A Near-Field Optical Microscope.
  • A Scanning Confocal Raman Spectrometer.

The PNL NTEGRA allows to implement more than 40 probe microscopy techniques including Atomic Force Acoustic Microscopy for local Young's modulus measurements, femtoampere current measurements, nanolithography with a resolution as small as 10 nm.

The PNL NTEGRA is equipped with a special temperature controlling system which makes it possible to perform measurements on samples in the temperature range from - 30°C up to 300°C (with thermal drift less than 10 nm/°C in the temperature range from - 30°C up to 200°C).

The PNL NTEGRA can be operated in three scan modes: by sample, by probe and in DualScanTM (simultaneous scan by probe and by sample). This enables researchers to solve various problems: measurements with the atomic-molecular resolution, operations with large samples, imaging of large areas (up to 200x200 micron), investigation of samples with complicated relief features (up to 16 micron peak-to-valley).

Scanners equipped with low-noise capacitance sensors can provide linear measurements with an accuracy as good as 0.4 %.

The PNL controller allows to measure broadband (up to 5 MHz) signals. This makes it possible to use such technique as Atomic Force Acoustic Microscopy (to determine the local Young's modulus, for example).



 
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