| TGZ2 |
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Calibration grating TGZ2 for SPM Z-axis calibration (step height 108,5±2nm).
Calibration grating TGZ2 is intended for Z-axis calibration of scanning probe microscopes and nonlinearity measurements.
Copyright © 2003, Nano Technology Instruments - Europe BV.
Copyright © 1998-2003, NT-MDT. All rights reserved. |
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Calibration grating TGZ2 for SPM Z-axis calibration (step height 108,5±2nm).



