Pra.Ma.

Test grating TGG1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, tip characterization.

Calibration grating TGQ1 is intended for simultaneous calibration in X,Y,and Z directions.

Test grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control.

Test grating TGX1 is intended for lateral calibration of SPM scanners, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip aspect ratio.

Calibration grating TGZ1 for SPM Z-axis calibration (step height 18,5±1nm).

Calibration grating TGZ2 for SPM Z-axis calibration (step height 108,5±2nm).

Calibration grating TGZ3 for SPM Z-axis calibration (step height 535±4nm).

Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.

Diffraction grating TDG01_Au is intended for submicron calibration scanning tunneling microscopes (STM) in the X or Y direction.

Standard test sample for Scanning Near Field Optical Microscope.

Grating set for Z-axis SPM calibration with three different height range - 20nm, 100nm, 500m.

Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate.

Grating set for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

Full set of calibration standards for SPM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions), detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.