Calibration Gratings
TGG1
tgg.jpgTest grating TGG1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, tip characterization.
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TGQ1
tgq.jpgCalibration grating TGQ1 is intended for simultaneous calibration in X,Y,and Z directions.
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TGT1
tgt.jpgTest grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control.
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TGX1
tgx.jpgTest grating TGX1 is intended for lateral calibration of SPM scanners, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip aspect ratio.
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TGZ1
tgz.jpgCalibration grating TGZ1 for SPM Z-axis calibration (step height 18,5±1nm).
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TGZ2
tgz.jpgCalibration grating TGZ2 for SPM Z-axis calibration (step height 108,5±2nm).
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TGZ3
tgz.jpgCalibration grating TGZ3 for SPM Z-axis calibration (step height 535±4nm).
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TDG01
tdg.jpgDiffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
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TDG01 Au
tdg.jpgDiffraction grating TDG01_Au is intended for submicron calibration scanning tunneling microscopes (STM) in the X or Y direction.
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SNG01
snom.jpgStandard test sample for Scanning Near Field Optical Microscope.
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TGS1
tgs1.jpgGrating set for Z-axis SPM calibration with three different height range - 20nm, 100nm, 500m.
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TGS1 PTB
tgs1.jpgCalibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate.
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TGS2
tgs2.jpgGrating set for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
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TGSFull
tgs2.jpgFull set of calibration standards for SPM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions), detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
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Henry J. Tillman

 

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