Multimode Delayline Detector Print E-mail

Features:

  • Extremely low dark counts
  • Linear response due to single event counting
  • 1 MHz count rate in 2D and 2D/time resolved mode
  • 50 MHz count rate in 7 channel mode
  • In-situ mode switching (no breaking of vacuum necessary)
  • Retrofitable on site, without changes to the analyzer

Applications:

  • Fermi surface mapping
  • Band structure mapping
  • Photoelectron diffraction measurements
  • Angular dispersion experiments in 2D mode
  • XPS, UPS, ESCA and AES in 7 channel mode
  • Stroboscopic experiments in 2D/time resolved mode
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Product description:

The segmented delayline detector combines high countrates (50MHz) with extremely high time resolution (125 ps) in one device. It is a 3D detector system, equipped with two lateral and one time dimension and can be mounted on a PHOIBOS 100 or 150 analyzer. The delayline method is based on measuring the time differences of signals.

 


 
 
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If you're not part of the solution, you're part of the precipitate

Henry J. Tillman

 

PraMa Strumentazione Scientifica

Partita IVA n. 00668970148

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