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The ConScan Objective provides the perfect combination of high resolution 3D confocal microscopy with the advantages of light microscopy. It opens up new possibilities in quantitative surface characterization in the micron range.
Features
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Ideal addition to CSM Instruments micro-range products for analysing the 3D topography of micro-scratches and micro-indentations.
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Non-contact measurement
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Large XY scanning range (using instrument's XY tables)
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High Z-axis dynamic range (up to 400 µm)
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Accurate measurement of 2D profiles, 3D topography and surface roughness
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Ability to perform measurements on transparent surfaces
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Measurements on rough or polished surfaces
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Wide range of objectives for different height ranges
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