Very often the microscope user is capturing an image that is a two dimensional representation of what is really a three dimensional object.
Micro-scale profilometry (Conscan objective) and Nano-scale imaging (Atomic Force Microscope) are available with our instruments.
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The ConScan Objective provides the perfect combination of high resolution 3D confocal microscopy with the advantages of light microscopy. It opens up new possibilities in quantitative surface characterization in the micron range.
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Atomic Force, or Scanning Probe Microscopy (AFM, SPM), is an extremely accurate and versatile technique for measuring surface topography and surface forces. A very fine sensor tip mounted to the end of a small deflecting spring - known as a cantilever - is brought into contact with the sample surface to be investigated. The sensor tip is moved across the surface in numerous line scans, which produces a three-dimensional image of the surface with ultra high resolution. This technique is especially useful for imaging residual scratches, indentations or other nanoscale surface features and for accurately measuring their dimensions.
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