|
1. Parabolic or spherical probe.
The model applies to probes with a spherical tip at small tip-sample separations  . The same result is obtained generally for the parabolic tip.
 ,  ,  :  .
 |
(1) |
In AFM measurements with silicon probe and sample at
2. Conical probe.
The model applies in case when tip curvature radius can be neglected as compared to tip-sample separation ( ).
 ,  , :  .
 |
(2) |
In AFM measurements with silicon probe and sample at
3. Pyramidal probe.
The model applies in case when tip curvature radius can be neglected as compared to tip-sample separation ().
, , :  .
 |
(3) |
In AFM measurements with silicon probe and sample at
4. Conical probe with a rounded tip.
The model is a generalization of (1) and (2) at arbitrary ratio between  and  .
 |
(4) |
where  . At  (semispherical probe) formula (4) transforms into formula (1) while at  (conical probe) – into formula (2).
In AFM measurements with silicon probe and sample at ,  , :  .
|
